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本应用笔记提供了恩智浦半导体74HC/74HCT系列典型失效的情况一个失效模式及影响分析(FMEA)。AN11044PinFMEAfor74HC/74HCTfamilyRev.1―16March2011ApplicationnoteDocumentinformationInfoContentKeywordsFMEA,HC,HCT,CMOSAbstractThisapplicationnoteprovidesaFailureModesandEffectsAnalysis(FMEA)fortheNXPSemiconductors’74HC/74HCTfamilyundertypicalfailuresituations.NXPSemiconductorsAN11044PinFMEAfor74HC/74HCTfamilyRevisionhistoryRevDateDescription……