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半導體可靠度測試資料(含環測專案及觀念)RELIABILITYTESTINGOFSEMICONDUCTORDEVICESV.RELIABILITYTESTINGOFSEMICONDUCTORDEVICES1.WHATISRELIABILITYTESTING?2.RELIABILITYTESTMETHODS3.ACCELERATEDLIFETEST4.ANALYSISOFTESTRESULTS4.1HOWTOUSEWEIBULLPROBABILITYPAPER3.3.3.3.3.4.1.1APPLICATIONOFWEIBULLPROBABILITYPAPER4.1.2FORMATOFWEIBULLPROBABILITYPAPER4.1.3PRINCIPLE4.1.4PROCEDUREFORUSE4.1.5INTERPRETATIONSOFWEIBULLPLOTTING4.2HOWTOUSECUMULATIVEHAZARDPAPER3.3.3.3.4.2.1APPLICATIONOFCUMULATIVEHAZARDPAPER4.2.2FORMATOFWEIBULLTYPECUMULATIVEHAZARDPAPER4.2.3PRINCIPLE4.2.4PROCEDUREFORUSE4.3PROCEDUREFORFAILURERATEPREDICTION3.WITH60%CONFIDENCELEVELRELIABILITYTESTINGOFSEMICONDUCTORDEVICESV.RELIABILITYTESTINGOFSEMICONDUCTORDEVICES1.WHATIS……