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sbeebeCHARACTERIZATION,MODELING,ANDDESIGNOFESDPROTECTIONCIRCUITSBySTEPHENG.BEEBEMarch1998TechnicalReportNo.xxxxxxxPreparedunderSemiconductorResearchCorporationContract94-SJ-116SemiconductorResearchCorporationContract94-YC-704SpecialsupportprovidedbyAdvancedMicroDevices,Sunnyvale,CaliforniaCopyrightbyStephenG.Beebe1998AllRightsReservediiAbstractFormorethan20years,susceptibilityofintegratedcircuitstoelectrostaticdischarge(ESD)haswarrantedtheuseofdedicatedon-chipESDprotectioncircuits.AlthoughtheproblemofESDinintegratedcircuits(ICs)hasreceivedmuchattentionindustry-widesincethelate1970s,designofrobustESDcircuitsremainschallengingbecauseESDfailuremechanismsbecomemoreacuteascriticalcirc……
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