标签: 6517a型静电计

利用吉时利 6517A 型静电计 ，可以在高达1000V的高压下实现 低噪声 （未滤波1fA p-p ）电流测量。利用精心设计的测量室和质量优良的 绝缘体 ，可以完全避免漏电流，精确测量高达10 17 W的电阻。如果温度稳定性优于0.1K，那么在温度依存性测量或光电导率测量期间，可以维持这个测量能力。利用SF 6 气体或高真空可以抑制高压电极之间空气的电子击穿。如果分子束沉积高真空系统中的线缆和泵浦得到屏蔽，可以在 薄膜 生长过程中对电流进行现场测量，而且具有相同的灵敏度，这对像有机分子材料这样的低电导率材料特别有用。   Current measurements at low noise levels (1fAp-p without filtering) can be performed at a maximum of 1000V with a Keithley 6517A Electrometer. By using a carefully designed measurement chamber and good quality insulators, leakage currents can be completely avoided, which allows measuring resistances up to 1017W accurately. This measurement capability can be maintained during temperature dependent or photoconductivity measurements if the temperature stability is better than 0.1K. Electrical breakdown of air between the electrodes at high voltages can be suppressed using an SF6 atmosphere or high vacuum. If cables and pumps inside a Molecular Beam Deposition high vacuum system are shielded, current measurements can be done in-situ during thin film growth with the same sensitivity, which is especially useful for materials with low conductivity like organic molecules.   致谢 吉时利仪器公司感谢新西兰麦克德尔米德先进材料和纳米技术研究所（惠灵顿市）的Felix Budde博士对本应用笔记的帮助。为了研究 电荷载体 的生产和再结合，Budde博士曾在德国斯图加特大学学习物理，并对 有机薄膜 的光电导率进行测量。作为其在瑞士伯尔尼大学博士工作的一部分，他准备了有机晶体，并利用光学和电子测量手段对其进行分析。Budde博士的联系方式是： SCPS,P.O. Box 600, Wellington, New Zealand (email:Felix.Budde@vuw.ac.nz)。   Keithley Instruments would like to thank Dr. Felix Budde of theMacDiarmid Institute of Advanced Materials and Nanotech-nology in Wellington (New Zealand) for contributing this appli-cation note. Dr. Budde studied Physics at the University ofStuttgart (Germany) and measured photoconductivity of organicfilms to study generation and recombination of charge carriers.As part of his PhD work at the University of Berne (Switzer-land), he prepared organic crystals and analyzed them with opti-cal and electrical measurements. He can be contacted at SCPS,P.O. Box 600, Wellington, New Zealand (email:Felix.Budde@vuw.ac.nz).     了解更多信息      要想了解有关 6517A 型静电计 / 高阻表 或者吉时利其他系列数字源表的更多信息，请点击http://www.keithley.com.cn/products/localizedproducts/highresistance/6517a，或者联系吉时利公司：全国免费电话800-810-1334手机用户请拨打440-650-1334。 登录吉时利官方微博（http://weibo.com/keithley）与专家进行互动。  绝缘体http://www.keithley.com.cn/promo/pr/searchresults?q=%E7%BB%9D%E7%BC%98%E4%BD%93 薄膜http://www.keithley.com.cn/promo/pr/keithleytestpatterns.htm/view 6517A型静电计/高阻表http://www.keithley.com.cn/products/localizedproducts/highresistance/6517a

利用吉时利 6517A 型静电计 ，可以在高达1000V的高压下实现 低噪声 （未滤波1fA p-p ）电流测量。利用精心设计的测量室和质量优良的 绝缘体 ，可以完全避免漏电流，精确测量高达10 17 W的电阻。如果温度稳定性优于0.1K，那么在温度依存性测量或光电导率测量期间，可以维持这个测量能力。利用SF 6 气体或高真空可以抑制高压电极之间空气的电子击穿。如果分子束沉积高真空系统中的线缆和泵浦得到屏蔽，可以在 薄膜 生长过程中对电流进行现场测量，而且具有相同的灵敏度，这对像有机分子材料这样的低电导率材料特别有用。   Current measurements at low noise levels (1fAp-p without filtering) can be performed at a maximum of 1000V with a Keithley 6517A Electrometer. By using a carefully designed measurement chamber and good quality insulators, leakage currents can be completely avoided, which allows measuring resistances up to 1017W accurately. This measurement capability can be maintained during temperature dependent or photoconductivity measurements if the temperature stability is better than 0.1K. Electrical breakdown of air between the electrodes at high voltages can be suppressed using an SF6 atmosphere or high vacuum. If cables and pumps inside a Molecular Beam Deposition high vacuum system are shielded, current measurements can be done in-situ during thin film growth with the same sensitivity, which is especially useful for materials with low conductivity like organic molecules.   致谢 吉时利仪器公司感谢新西兰麦克德尔米德先进材料和纳米技术研究所（惠灵顿市）的Felix Budde博士对本应用笔记的帮助。为了研究 电荷载体 的生产和再结合，Budde博士曾在德国斯图加特大学学习物理，并对 有机薄膜 的光电导率进行测量。作为其在瑞士伯尔尼大学博士工作的一部分，他准备了有机晶体，并利用光学和电子测量手段对其进行分析。Budde博士的联系方式是： SCPS,P.O. Box 600, Wellington, New Zealand (email:Felix.Budde@vuw.ac.nz)。   Keithley Instruments would like to thank Dr. Felix Budde of theMacDiarmid Institute of Advanced Materials and Nanotech-nology in Wellington (New Zealand) for contributing this appli-cation note. Dr. Budde studied Physics at the University ofStuttgart (Germany) and measured photoconductivity of organicfilms to study generation and recombination of charge carriers.As part of his PhD work at the University of Berne (Switzer-land), he prepared organic crystals and analyzed them with opti-cal and electrical measurements. He can be contacted at SCPS,P.O. Box 600, Wellington, New Zealand (email:Felix.Budde@vuw.ac.nz).     了解更多信息      要想了解有关 6517A 型静电计 / 高阻表 或者吉时利其他系列数字源表的更多信息，请点击http://www.keithley.com.cn/products/localizedproducts/highresistance/6517a，或者联系吉时利公司：全国免费电话800-810-1334手机用户请拨打440-650-1334。 登录吉时利官方微博（http://weibo.com/keithley）与专家进行互动。       绝缘体http://www.keithley.com.cn/promo/pr/searchresults?q=%E7%BB%9D%E7%BC%98%E4%BD%93 薄膜http://www.keithley.com.cn/promo/pr/keithleytestpatterns.htm/view 6517A型静电计/高阻表http://www.keithley.com.cn/products/localizedproducts/highresistance/6517a

利用吉时利 6517A 型静电计 ，可以在高达1000V的高压下实现 低噪声 （未滤波1fA p-p ）电流测量。利用精心设计的测量室和质量优良的 绝缘体 ，可以完全避免漏电流，精确测量高达10 17 W的电阻。如果温度稳定性优于0.1K，那么在温度依存性测量或光电导率测量期间，可以维持这个测量能力。利用SF 6 气体或高真空可以抑制高压电极之间空气的电子击穿。如果分子束沉积高真空系统中的线缆和泵浦得到屏蔽，可以在 薄膜 生长过程中对电流进行现场测量，而且具有相同的灵敏度，这对像有机分子材料这样的低电导率材料特别有用。   Current measurements at low noise levels (1fAp-p without filtering) can be performed at a maximum of 1000V with a Keithley 6517A Electrometer. By using a carefully designed measurement chamber and good quality insulators, leakage currents can be completely avoided, which allows measuring resistances up to 1017W accurately. This measurement capability can be maintained during temperature dependent or photoconductivity measurements if the temperature stability is better than 0.1K. Electrical breakdown of air between the electrodes at high voltages can be suppressed using an SF6 atmosphere or high vacuum. If cables and pumps inside a Molecular Beam Deposition high vacuum system are shielded, current measurements can be done in-situ during thin film growth with the same sensitivity, which is especially useful for materials with low conductivity like organic molecules.   致谢 吉时利仪器公司感谢新西兰麦克德尔米德先进材料和纳米技术研究所（惠灵顿市）的Felix Budde博士对本应用笔记的帮助。为了研究 电荷载体 的生产和再结合，Budde博士曾在德国斯图加特大学学习物理，并对 有机薄膜 的光电导率进行测量。作为其在瑞士伯尔尼大学博士工作的一部分，他准备了有机晶体，并利用光学和电子测量手段对其进行分析。Budde博士的联系方式是： SCPS,P.O. Box 600, Wellington, New Zealand (email:Felix.Budde@vuw.ac.nz)。   Keithley Instruments would like to thank Dr. Felix Budde of theMacDiarmid Institute of Advanced Materials and Nanotech-nology in Wellington (New Zealand) for contributing this appli-cation note. Dr. Budde studied Physics at the University ofStuttgart (Germany) and measured photoconductivity of organicfilms to study generation and recombination of charge carriers.As part of his PhD work at the University of Berne (Switzer-land), he prepared organic crystals and analyzed them with opti-cal and electrical measurements. He can be contacted at SCPS,P.O. Box 600, Wellington, New Zealand (email:Felix.Budde@vuw.ac.nz).     了解更多信息      要想了解有关 6517A 型静电计 / 高阻表 或者吉时利其他系列数字源表的更多信息，请点击http://www.keithley.com.cn/products/localizedproducts/highresistance/6517a，或者联系吉时利公司：全国免费电话800-810-1334手机用户请拨打440-650-1334。 登录吉时利官方微博（http://weibo.com/keithley）与专家进行互动。   吉时利仪器公司（中国）市场部 (T) 8008101334,  8610 82255010,  82255011   绝缘体http://www.keithley.com.cn/promo/pr/searchresults?q=%E7%BB%9D%E7%BC%98%E4%BD%93 薄膜http://www.keithley.com.cn/promo/pr/keithleytestpatterns.htm/view 6517A型静电计/高阻表http://www.keithley.com.cn/products/localizedproducts/highresistance/6517a

在测量尺寸较小样本时，样本安装基底可能会成为测量误差的主要来源，这是其体积和表面电阻率造成的。通过（可能被污染的）基底表面阻止 漏电流 的方法是，使用两个分开的绝缘片，而不是将样本放置在一个绝缘片上。为了简化对不同尺寸小型样本的测试，安装硬件应当包括测微螺旋，以调整两个 绝缘片 之间的缝隙宽带。 When characterizing small samples, the substrate on which thesample is mounted can become a significant source of measure-ment error, as result of both its volume and surface resistivity.The obvious way to prevent any leakage current through a (pos-sibly contaminated) substrate surface is to use two insulator plates separated by a gap, rather than placing the sample on asingle plate. To simplify testing small samples of various sizes,the mounting hardware should include a micrometer screw toadjust the width of this gap.   图2: 使用液体镓（不会弄湿大多数材料）可以对同一晶体的不同方向进行测量。为了避免造成漏电流，样本要放置到两个蓝宝石片构成的间隙中。   Figure 2: Using liquid gallium, which doesn’t wet most materials, allows measuring conductivity in different directions on thesame crystal. To avoid creating leakage currents, the sample is placed on a gap formed by two sapphire plates.     了解更多信息      要想了解有关 6517A 型静电计 / 高阻表 或者吉时利其他系列数字源表的更多信息，请点击http://www.keithley.com.cn/products/localizedproducts/highresistance/6517a，或者联系吉时利公司：全国免费电话800-810-1334手机用户请拨打440-650-1334。 登录吉时利官方微博（http://weibo.com/keithley）与专家进行互动。   吉时利仪器公司（中国）市场部 (T) 8008101334,  8610 82255010,  82255011       如何避免输入端加入过高的电压时损坏仪器的输入电路？http://www.keithley.com.cn/llm/a/13.html 绝缘片http://www.keithley.com.cn/llm/a/30.html 6517A型静电计/高阻表http://www.keithley.com.cn/products/localizedproducts/highresistance/6517a