标签: 02028

02028AUTOMATICINSPECTIONSYSTEMFORCMOSCAMERADEFECTByoung-WookChoi*,KukWonKo**,Kyoung-ChulKoh***,BokShinAhn*******Dept.ofElectricalEngineering,SeoulNat'lUniv.ofTechnology,Seoul,KoreaDept.ofControlandMeasurementEngineering,SunMoonUni.,Asanshi,Korea***Dept.ofMechanicalEngineering,SunMoonUniv.,Asanshi,Korea****CEOofP&CTech,Anyangshi,KoreaAbstract:Thispaperpresentsadevelopmentofautomaticcomplementarymetal-oxidesemiconductor(CMOS)camerainspectionsystemtoexaminedefects.Theimagecaptureboardbasedonembeddedlinuxusingsystem-on-a-chip(SoC)andacomplexprogrammablelogicdevice(CPLD)isdevelopedtocaptureCMOSsensordata.ThecapturedsensordataistransferredtothehostcomputerthroughTCP/IPsocketcommunicatio……