02028AUTOMATIC INSPECTION SYSTEM FOR CMOS CAMERA DEFECT Byoung-Wook Choi*, Kuk Won Ko**, Kyoung-Chul Koh*** , Bok Shin Ahn**** * ** Dept. of Electrical Engineering, Seoul Nat'l Univ. of Technology, Seoul, Korea Dept. of Control and Measurement Engineering, Sun Moon Uni., Asanshi, Korea *** Dept. of Mechanical Engineering, Sun Moon Univ., Asanshi, Korea **** CEO of P&C Tech, Anyangshi, Korea Abstract: This paper presents a development of automatic complementary metal-oxidesemiconductor (CMOS) camera inspection system to examine defects. The image capture board based on embedded linux using system-on-a-chip (SoC) and a complex programmable logic device (CPLD) is developed to capture CMOS sensor data. The captured sensor data is transferred to the host computer through TCP/IP socket communicatio……