标签: characterization

伯克利博士论文：TestingandCharacterizationofAnalogSystemsUsingBehavioralModelsandOptimalExperimentalDesign

ModernCharacterizationofElectromagneticSystemsandItsAssociatedMetrology

Characterizationofacomplementarysensitivitypropertyinfeedbackcontrol-Aninformationtheoreticapproach(原辰次)

Afastclosed-loopprocessdynamicscharacterization

SemiconductorMaterialandDeviceCharacterization[DieterK.Schroder]

Thischaracterizationcircuit,plusaPCandsomesoftware,accuratelymeasuresthefulldischargecycleforarechargeableAAcell.Cellcapacityandoutputresistancecaneasilybedeterminedfromthecurveresultingfromthesemeasurements.……

Abstract:ThisapplicationnotedescribestechniquesofusingaPCbasedDigitalI/OBoardtocharacterizeanalog-to-digitalconverters(ADCs).ItwilllookatstaticDCparameterssuchasintegralnonlinearity(INL),differentialnonlinearity(DNL),gain,andoffseterrors,butalsonoise,internalreferencevoltage,andchannel-to-channelcouplingandmatching,aswellasthesupplyvoltagedependence.Maxim>AppNotes>A/DandD/ACONVERSION/SAMPLINGCIRCUITSKeywords:ADC,characterization,INL,DNL,gain,offset,channelcouplingandmatching,NationalIntruments,Aug01,2001NI,Labview,PC,DAQ,analogtodigitalconvertersAPPLICATIONNOTE633BenchCharacterizationofADCsUsingaLow-CostPC-BasedData-AcquisitionBoardAbstract:ThisapplicationnotedescribestechniquesofusingaPCbasedDigitalI/OBoardtocharacterizeanalog-to-digitalconverters(ADCs).ItwilllookatstaticDCparameterssuchasintegralnonlinearity(INL),differentialnonlinearity(DNL),gain,andoffseterrors,butalsonoise,internalreferencevoltage,andchannel-to-channelcouplingandmatching,aswellasthesupplyvoltagedependence.Withtheincreasingcomplexityofanalog-to-digi……

Large-signalcharacterizationandmodelingofnonlineardevicesusingscatteringparametersLarge-signalcharacterizationandmodelingofnonlineardevicesusingscatteringparametersJohnB.CallThesissubmittedtotheFacultyoftheVirginiaPolytechnicInstituteandStateUniversityinpartialfulfillmentoftherequirementsforthedegreeofMasterofScienceinElectricalEngineeringWilliamA.Davis,ChairWarrenL.StutzmanDennisG.SweeneySeptember13,2002Blacksburg,VirginiaKeywords:blackboxmodel,!-parameters,microwavemeasurement,load-pullCopyright2002byJohnB.CallAllrightsreservedLarge-signalcharacterizationandmodelingofnonlineardevicesusingscatteringparametersJohnB.Call(ABSTRACT)Characterizationandmodelingofdevicesathighdrivelevelsoftenrequiresspecializedequipmentandmeasurementtechniques.Manylarge-signaldevi……