Abstract: This application note describes techniques of using a PC based Digital I/O Board to characterize analog-to-digital converters (ADCs). It will look at static DC parameters such as integral nonlinearity (INL), differential nonlinearity (DNL), gain, and offset errors, but also noise, internal reference voltage, and channel-to-channel coupling and matching, as well as the supply voltage dependence. Maxim > App Notes > A/D and D/A CONVERSION/SAMPLING CIRCUITS Keywords: ADC, characterization, INL, DNL, gain, offset, channel coupling and matching, National Intruments, Aug 01, 2001 NI, Labview, PC, DAQ, analog to digital converters APPLICATION NOTE 633 Bench Characterization of ADCs Using a Low-Cost PC-Based Data- Acquisition Board Abstract: This application note describes techniques of using a PC based Digital I/O Board to characterize analog-to-digital converters (ADCs). It will look at static DC parameters such as integral nonlinearity (INL), differential nonlinearity (DNL), gain, and offset errors, but also noise, internal reference voltage, and channel- to-channel coupling and matching, as well as the supply voltage dependence. With the increasing complexity of analog-to-digi……