Large-signal characterization and modeling of nonlinear devices using scattering parameters Large-signal characterization and modeling of nonlinear devices using scattering parameters John B. Call Thesis submitted to the Faculty of the Virginia Polytechnic Institute and State University in partial fulfillment of the requirements for the degree of Master of Science in Electrical Engineering William A. Davis, Chair Warren L. Stutzman Dennis G. Sweeney September 13, 2002 Blacksburg, Virginia Keywords: black box model, ! -parameters, microwave measurement, load-pull Copyright 2002 by John B. Call All rights reserved Large-signal characterization and modeling of nonlinear devices using scattering parameters John B. Call (ABSTRACT) Characterization and modeling of devices at high drive levels often requires specialized equipment and measurement techniques. Many large-signal devi……