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1.Rated Power: The maximum value of power which can be continuously loaded to a resistor at a rated ambient temperature.

2.Rated Voltage: The maximum value of D.C. voltage or A.C. voltage capable of being applied continuously to a resistor at the rated ambient temperature. Rated Voltage shall be calculated from the following formula. Rated Voltage(V) = {Rated Power(W) * Nominal Resistance()} When the nominal resistance value exceeds the critical resistance value, the rated voltage is limited to the maximum working voltage. 

3.Critical Resistance Value The maximum nominal resistance value at which the rated power can be loaded without exceeding the maximum working voltage. 

4.Maximum Working Voltage: The maximum value of D.C. voltage or A.C. voltage capable of being applied continuously to a resistor. 

5.Maximum Overload Voltage: The maximum value of D.C. voltage or A.C. voltage capable of being applied to a resistor for 5 seconds. 

6.Dielectric Withstanding Voltage: A.C. Voltage that can be applied to a designated spot between the electrode and the outer coating for a minute in dielectric withstanding voltage test. 

7.Rated Ambient Temperature: The maximum ambient temperature at which a resistor is capable of being used continuously with the rated load applied.

8.Derating Curve: A curve that expressed the relation between ambient temperature and the maximum power, the later is usually expressed in percentage.

9.Temperature Coefficient of Resistance (T.C.R.): T.C.R. shall be calculated from the following formula.

T.C.R. (ppM/°C) = {(R - Ro)/Ro} * {1/(T - To)} * 106

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Where: R: Measured Resistance () at T

Ro: Measured Resistance () at To

T: Measured Test Temperature (°C)

To: Measured Base Temperature (°C) 

凸凹电阻排性能比较:

What are advantages and disadvantages of convex vs. concave chip resistor arrays?

Concave: -self-centering during reflow solder process

-More difficult to inspect solder points.

Convex: -easier to inspect solder points.

*Really no difference, just customer perference, usually based on inspection/vision systems.