Single Event Effects (SEE) Testing of the ISL705xRH/EH and ISL706xRH/EH Rad Hard Supervisory Circuits Application Note 1651 Authors: Oscar Mansilla, Eric Thomson, Dave Turner and Nick van Vonno Single Event Effects (SEE) Testing of the ISL705xRH/EH and ISL706xRH/EH Rad Hard Supervisory Circuits Introduction SEE Test Objective The intense heavy ion environment encountered in space The objectives of SEE testing of the ISL705xRH/EH and applications can cause a variety of transient and destructive ISL706xRH/EH were to evaluate its susceptibility to single effects in analog circuits, including single-event la……