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TA700 Compliance User Guide
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类别: 测试测量
时间:2020-01-02
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TA700 Compliance User Guide TA660 Device Compliance Test User's Guide TA660 Device Compliance Test User's Guide Scope The scope of this document is to familiarize the user with various sections of the Device Compliance Test where IUT interaction is required. This document should allow the user to prepare for these tests in advance. Description Compliance Test program includes three test categories which require interaction from IUT. These are DS_XX (device status test), MP_XX (General Component Protocol checklist of master) and 1.XX (Component Protocol checklist for a master device) tests. All other tests are performed automatically. In these tests the TA660 is used as target and the IUT is the master. The TA660 as a target device needs to have three different addresses for Memory, I/O and……
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