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Device Structures and Material...
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类别: 消费电子
时间:2020-01-14
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Device Structures and Materials for Scaling to Si Limits and BeyondDevice Structures and Materials for Scaling to Si Limits and Beyond Krishna Saraswat Materials Structures and Devices MARCO Focus Research Center 1 Focus Research Center Program: Time Scale Essential complement to ongoing, nearterm efforts Focus where evolutionary R&D may not find solutions Technology scaling 0.13m 2002 90nm 2004 65nm 2006 45nm 2008 30-20nm 2010 10nm? 2012+ current near-term R&D... MARCO FRCP Agenda 2 The Four Current Focus Centers Design and Test Focus Center Director: Jan Rabaey, Berkeley Component-based design, constructive fabrics, fully programmable systems, test, verification, energy & power, calibrating achievable designs Lead School: U.C. Berkeley CMU MIT Penn State Princeton Purdue Stanford UCLA UC ……
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