Device Structures and Material...
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Device Structures and Materials for Scaling to Si Limits and BeyondDevice Structures and Materials for Scaling to Si Limits and Beyond
Krishna Saraswat Materials Structures and Devices MARCO Focus Research Center
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Focus Research Center Program: Time Scale
Essential complement to ongoing, nearterm efforts Focus where evolutionary R&D may not find solutions
Technology scaling
0.13m
2002
90nm
2004
65nm
2006
45nm
2008
30-20nm
2010
10nm?
2012+
current near-term R&D...
MARCO FRCP Agenda
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The Four Current Focus Centers
Design and Test Focus Center
Director: Jan Rabaey, Berkeley
Component-based design, constructive fabrics, fully programmable systems, test, verification, energy & power, calibrating achievable designs
Lead School: U.C. Berkeley
CMU MIT Penn State Princeton Purdue Stanford UCLA UC ……
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