04100881186 IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS―II: EXPRESS BRIEFS, VOL. 54, NO. 2, FEBRUARY 2007 RF Built-in Self Test of a Wireless Transmitter Robert Bogdan Staszewski, Imran Bashir, and Oren Eliezer Abstract―RF frequency synthesizers and transmitters for wireless system-on-chips have recently migrated to low-cost deep-submicrometer CMOS processes that facilitate all-digital implementations. In addition to all the benets of lower power, lower silicon cost, reduced board area, and improved performance that the scaled CMOS integration entails, the testing costs for RF performance and wireless standard compliance could also be drastically reduced. In this brief, we propose a built-in self test (BIST) method, which is based on the premise that the internal frequency synthesizer and transmit……