摘要：统计过程控制计算器（斯佩克）艾滋病的过程中产量的预测和分析。惠普® 50G计算器或免费的PC模拟器可以使用计算器。Maxim > Design Support > App Notes > A/D and D/A Conversion/Sampling Circuits > APP 5063 Maxim > Design Support > App Notes > Automatic Test Equipment (ATE) > APP 5063 Maxim > Design Support > App Notes > Digital Potentiometers > APP 5063 Keywords: statistical process control, yield defects, Gaussian distribution, Six Sigma, prediction yield analysis, defect opportunity per million, DOPM, normal distribution curve, SPCC, SPC Aug 18, 2011 APPLICATION NOTE 5063 Statistical Process Control Calculator Tutorial By: Bill Laumeister, Strategic Applications Engineer Abstract: The Statistical Process Control Calculator (SPCC) aids in the prediction and analysis of process yi……