射频CMOS集成电路原理和设计-9 Noise
Contents
Introduction
Thermal noise
Shot noise
Flicker noise
Popcorn noise
Two-port noise theories
Two-Port Noise Parameters for MOSFET
Lecture 7, Oct. 21, 2003
1
Introduction
The noise phenomena are caused by the small current and
voltage fluctuations that are generated within the device
themselves.
The existence of noise is basically due to the fact that
electrical charge is not continuous but is carried in discrete
amount equal to the electron charge.
The study of noise is important since it represents a lower
limit to the size of electrical signal that can be amplified by a
……
