资料
  • 资料
  • 专题
Integrated Circuit Test Engineering
推荐星级:
类别: 测试测量
时间:2020-01-02
大小:2.65MB
阅读数:311
上传用户:微风DS
查看他发布的资源
下载次数
2
所需E币
4
ebi
新用户注册即送 300 E币
更多E币赚取方法,请查看
close
资料介绍
Integrated Circuit Test EngineeringIntegrated Circuit Test Engineering Ian A. Grout Integrated Circuit Test Engineering Modern Techniques With 149 Figures 123 Ian A. Grout, PhD Department of Electronic and Computer Engineering University of Limerick Limerick Ireland British Library Cataloguing in Publication Data Grout, Ian Integrated circuit test engineering: modern techniques 1. Integrated circuits - Verication I. Title 621.3’81548 ISBN-10: 1846280230 Library of Congress Control Number: 2005929631 ISBN-10: 1-84628-023-0 e-ISBN: 1-84628-173-3 Printed on acid-free paper ISBN-13: 978-1-84628-023-8 Springer-Verlag London Limited 2006 HSPICE is the registered trademark of Synopsys, Inc., 700 East Middleeld Road, Mountain View, CA 94043, U.S.A. http://www.synopsys.com/home.html MA……
版权说明:本资料由用户提供并上传,仅用于学习交流;若内容存在侵权,请进行举报,或 联系我们 删除。
PARTNER CONTENT
相关评论 (下载后评价送E币 我要评论)
没有更多评论了
  • 可能感兴趣
  • 关注本资料的网友还下载了
  • 技术白皮书