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类别: 消费电子
时间:2020-01-16
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Robust Sharpness MetricKurtosis MeasurementA ROBUST IMAGE SHARPNESS METRIC BASED ON KURTOSIS MEASUREMENT OF WAVELET COEFFICIENTS R. Ferzli, Lina J. Karam Department of Electrical Engineering Arizona State University Tempe, AZ 85287-5706 ABSTRACT In this paper, a robust sharpness metric for noisy images is presented. The proposed method, relying on the Lipschitz regularity properties separating the signal singularities from the noise singularities, applies the dyadic wavelet transform and then measures the kurtosis of the two-dimensional discrete Fourier transform of the wavelet coefcients across large scales. In contrast to other sharpness metrics, the proposed technique will perform well under low to moderate SNR since the noise will be reduced across wavelet scales. Simulation results reveal that the proposed image sharpness metr……
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