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单个事件的影响ISL70218SRH测试、双36 V方根硬低功率运作功率放大器
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时间:2019-12-24
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Single Event Effects Testing of the ISL70218SRH, Dual 36V Rad Hard Low Power Operation Amplifiers Application Note 1677 Authors: Oscar Mansilla, Richard Hood, Lawrence Pearce, Eric Thomson and Nick Vanvonno Single Event Effects Testing of the ISL70218SRH, Dual 36V Rad Hard Low Power Operation Amplifiers Introduction SEE Test Objective The intense heavy ion environment encountered in space The objectives of SEE testing on the ISL70218SRH were to applications can cause a variety of transient and destructive evaluate its susceptibility to single event latch-up and ……
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