Select nail rule | ||||
Test probe's size | Safe Distance | Remark | ||
Nail to Nail (Between test points center distance) |
39mil to 39mil | 38mil | such size of test probe will cause more NTF | |
39mil to 50mil | 43mil | such size of test probe will cause more NTF | ||
50mil to 50mil | 50mil | such size of test probe will cause more NTF | ||
50mil to 75mil | 58mil | such size of test probe will cause more NTF | ||
75mil to 75mil | 68mil | |||
75mil to 100mil | 77mil | |||
100mil to 100mil | 86mil | |||
Nail to device body (Test point center to device border distance) |
39mil | 3mm below height device | 16mil | such size of test probe will cause more NTF |
50mil | 20mil | such size of test probe will cause more NTF | ||
75mil | 24.5mil | |||
100mil | 29.5mil | |||
39mil | 3mm-5mm height device | 36mil | such size of test probe will cause more NTF | |
50mil | 40mil | such size of test probe will cause more NTF | ||
75mil | 47mil | |||
100mil | 54mil | |||
39mil | 5mm-8mm height device | 65.5mil | such size of test probe will cause more NTF | |
50mil | 70mil | such size of test probe will cause more NTF | ||
75mil | 77mil | |||
100mil | 84mil | |||
39mil | 8mm-12mm height device | 98.5mil | such size of test probe will cause more NTF | |
50mil | 98.5mil | such size of test probe will cause more NTF | ||
75mil | 108.5mil | |||
100mil | 118mil | |||
39mil | 12mm-16mm height device | 115mil | such size of test probe will cause more NTF | |
50mil | 118mil | such size of test probe will cause more NTF | ||
75mil | 126mil | |||
100mil | 133mil | |||
39mil | 16mm-20mm height device | 134.5mil | such size of test probe will cause more NTF | |
50mil | 138mil | such size of test probe will cause more NTF | ||
75mil | 146mil | |||
100mil | 153mil | |||
39mil | 20mm above height device | 144mil | such size of test probe will cause more NTF | |
50mil | 148mil | such size of test probe will cause more NTF | ||
75mil | 155.5mil | |||
100mil | 163mil | |||
Nail to testjet (Test point center to testjet border distance) |
39mil | 34mil | such size of test probe will cause more NTF | |
50mil | 39mil | such size of test probe will cause more NTF | ||
75mil | 47mil | |||
100mil | 54mil | |||
Nail to DIP pin (Test point center to device pin distance) |
39mil | 53mil | such size of test probe will cause more NTF | |
50mil | 58mil | such size of test probe will cause more NTF | ||
75mil | 68mil | |||
100mil | 77mil | |||
Nail to tooling hole (Test point center to tooling hole border distance) |
39mil | 135mil | such size of test probe will cause more NTF | |
50mil | 140mil | such size of test probe will cause more NTF | ||
75mil | 145mil | |||
100mil | 150mil | |||
Nail to board boby (Test point center to board border distance) |
39mil | 36mil | such size of test probe will cause more NTF | |
50mil | 40mil | such size of test probe will cause more NTF | ||
75mil | 47mil | |||
100mil | 54mil | |||
Easy to pour parts,Within easy fall+safe distabce (Test point center to within easy fall) |
39mil | 113mil | such size of test probe will cause more NTF | |
50mil | 118mil | such size of test probe will cause more NTF | ||
75mil | 126mil | |||
100mil | 133mil |
作者: 用户3889177, 来源:面包板社区
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