用于当今高功率器件的高速脉冲测量 application brief Achieving Fast Pulse Measurements for Today’s High Power Devices Green initiatives and energy efficiency standards worldwide have motivated engineers to find ways to design more efficient semiconductor devices and integrated circuits, and measuring the true state of these devices without the effects of self-heating is critical. Test instruments with only DC capability can deliver enough power to a device to cause heat dissipation that alters its characteristics. Pulsed characterization is a solution to this issue. The use of a pulsed stimulus demands faster measurements. Traditional precision SMUs (source-measure units) use integrating ADCs. Although it offer……