《并行测试技术》 www.keithley.com 1st Edition Parallel Test Technology The New Paradigm for Parametric Testing Parallel Test Technology: The New Paradigm for Parametric Testing 1st Edition A G R E A T E R M E A S U R E O F C O N F I D E N C E Foreword As the dimensions of modern integrated circuits continue to shrink and the use of innovative materials grows, device fabrication and parametric testing have become more challenging with each passing year. Every device shrink, every process innova- tion, and every new material has made the repeatability and volume of data produced by parametric test more critical to process development and controlling modern ……