资料
  • 资料
  • 专题
ADI信号发生器解决方案
推荐星级:
类别: 测试测量
时间:2020-01-02
大小:73.14KB
阅读数:192
上传用户:16245458_qq.com
查看他发布的资源
下载次数
0
所需E币
3
ebi
新用户注册即送 300 E币
更多E币赚取方法,请查看
close
资料介绍
  A high quality signal source is the foundation for high capability instrumentation. To confirm the proper operation of an instrument or device, waveforms are injected into the device under test and analyzed as they progress through the device. Analog Devices has the solution for your next generation design. We offer high performance ADCs, amplifiers, clocks, comparators, DACs, DDS, Isolators, Muxes, Processors and other key components 获取更多权威电子资料 请登陆 www.eepw.com.cn ADI信号发生器解决方案 A high quality signal source is the foundation for high capability instrumentation. To confirm the proper operation of an instrument or device, waveforms are injected into the device under test and analyzed as they progress through the device. Analog Devices has the solution for your next generation design. We offer high performance ADCs, amplifiers, clocks, comparators, DACs, DDS, Isolators, Muxes, Processors and other key components. Application Notes AN-747: Timing Synchronization for Multiple AD9786 TxDACs (pdf, 2,447,219 bytes) AN-595: Understanding Pin Compatibility in the TxDAC® Line of High Speed D/A Converters (pdf, 37,046 bytes) AN-535: Digital ……
版权说明:本资料由用户提供并上传,仅用于学习交流;若内容存在侵权,请进行举报,或 联系我们 删除。
相关评论 (下载后评价送E币 我要评论)
没有更多评论了
  • 可能感兴趣
  • 关注本资料的网友还下载了
  • 技术白皮书