DesignCon 2006 - Group Delay and its Impact on Serial Data Transmission and TestingDesignCon 2006 Group Delay and its Impact on Serial Data Transmission and Testing Peter J. Pupalaikis, LeCroy Corporation PeterP@LeCroy.com Abstract This paper is an extension of last years paper entitled “Eye Pattern Measurements in Scopes”. Last years paper pointed out the effects of bandwidth, roll-off rate, flatness, and group delay characteristics along with probe loading and return-loss. It only glossed over the more complicated topic of phase response and group delay. This paper goes into greater detail on this topic and explains what group delay is, what its impact is, what theoretically correct group delay is, and how group delay is compensated in both serial data test equipment and serial data transmitters and receivers. Author(s) Biography Pete Pupalaikis is Principal……