负偏置温度不稳定性(NBTI) 对 90 nm PMOS 的影响 White Paper: Virtex-4 Family R WP224 (v1.1) November 21, 2005 Negative-Bias Temperature Instability (NBTI) Effects in 90 nm PMOS By: Austin Lesea and Andrew Percey This paper describes Negative-Bias Temperature Instability (NBTI), an unwanted transistor behavior that is pervasive in all deep sub-micron designs. It also describes how Xilinx has proactiv……