电感 RELIABILITY TEST CONDITIONS WIRE WOUND CHIP INDUCTORS TYPE FOR SMD322522/453232 / SMTSDR322520/453226 / SMDCHGR0603/0805/1008/1210 / SMDFSR1008 / SMTS | | |Item (項目) |Required |Test Method/Condition (測試 | | |Characteristics |方法) | | |(要求) | | |High temperature |1.No case deformation|Temperature: 85±2℃ Time : | |Storage test |or |96±2 hours | | |change in appearance.|Tested not less than 1 hour,| |Reference |2.ΔL/L≦10% |nor more than 2 hours at | |documents: |3.ΔQ/Q≦30% |room temperature. | |MIL-STD-202G Method|4.ΔDCR/DCR≦10% |[pic] ……