Select nail rule
      Test probe's size     Safe Distance  Remark
  Nail to Nail
    （Between test points center distance）  39mil to 39mil     38mil  such size of test  probe will cause more NTF
  39mil to 50mil     43mil  such size of test  probe will cause more NTF
  50mil to 50mil     50mil  such size of test  probe will cause more NTF
  50mil to 75mil     58mil  such size of test  probe will cause more NTF
  75mil to 75mil     68mil  
  75mil to 100mil     77mil  
  100mil to 100mil     86mil  
  Nail to device body
    (Test point center to device border distance)  39mil  3mm below height device  16mil  such size of test  probe will cause more NTF
  50mil  20mil  such size of test  probe will cause more NTF
  75mil  24.5mil  
  100mil  29.5mil  
  39mil  3mm-5mm height device  36mil  such size of test  probe will cause more NTF
  50mil  40mil  such size of test  probe will cause more NTF
  75mil  47mil  
  100mil  54mil  
  39mil  5mm-8mm height device  65.5mil  such size of test  probe will cause more NTF
  50mil  70mil  such size of test  probe will cause more NTF
  75mil  77mil  
  100mil  84mil  
  39mil  8mm-12mm height device  98.5mil  such size of test  probe will cause more NTF
  50mil  98.5mil  such size of test  probe will cause more NTF
  75mil  108.5mil  
  100mil  118mil  
  39mil  12mm-16mm height device  115mil  such size of test  probe will cause more NTF
  50mil  118mil  such size of test  probe will cause more NTF
  75mil  126mil  
  100mil  133mil  
  39mil  16mm-20mm height device  134.5mil  such size of test  probe will cause more NTF
  50mil  138mil  such size of test  probe will cause more NTF
  75mil  146mil  
  100mil  153mil  
  39mil  20mm above height device  144mil  such size of test  probe will cause more NTF
  50mil  148mil  such size of test  probe will cause more NTF
  75mil  155.5mil  
  100mil  163mil  
  Nail to testjet
    (Test point center to testjet border distance)  39mil     34mil  such size of test  probe will cause more NTF
  50mil     39mil  such size of test  probe will cause more NTF
  75mil     47mil  
  100mil     54mil  
  Nail to DIP pin
    (Test point center to device pin distance)  39mil     53mil  such size of test  probe will cause more NTF
  50mil     58mil  such size of test  probe will cause more NTF
  75mil     68mil  
  100mil     77mil  
  Nail to tooling hole
    (Test point center to tooling hole border distance)  39mil     135mil  such size of test  probe will cause more NTF
  50mil     140mil  such size of test  probe will cause more NTF
  75mil     145mil  
  100mil     150mil  
  Nail to board boby
    (Test point center to board border distance)  39mil     36mil  such size of test  probe will cause more NTF
  50mil     40mil  such size of test  probe will cause more NTF
  75mil     47mil  
  100mil     54mil  
  Easy to pour parts,Within easy fall+safe distabce
    (Test point center to within easy fall)  39mil     113mil  such size of test  probe will cause more NTF
  50mil     118mil  such size of test  probe will cause more NTF
  75mil     126mil  
  100mil     133mil